Real-Time Technique for Semiconductor Material Parameter Measurement Under Continuous Neutron Irradiation with High Integral Fluence

Authors

• Vasil’evskii, I.S.
• Klochkov, A.N.
• Nekrasov, P.V.
• Vinichenko, A.N.
• Kargin, N.I.
• Yskakov, A.
• Bulavin, M.V.
• Galushko, A.V.
• Bekbayev, A.
• Mukhametuly, B.
• Myrzabekova, E.
• Shegebayev, N.
• Kulikbayeva, D.
• Nurulin, R.
• Nurkasova, A.
• Baitugulov, R.

Fields of knowledge